Advances in Decision Sciences
Volume 2 (1998), Issue 2, Pages 193-199
doi:10.1155/S117391269800011X
An investigation of chaos in the $RL$-diode circuit using the BDS test
R. Kasap1
and E. Kurt2
1Department of Statistics, Gazi University, Ankara, Turkey
2Department of Physics Education, Gazi University, Ankara, Turkey
Abstract
In this paper, RL-diode circuit driven by a sinusoidal voltage is employed to obtain nonlinear experimental data. The BDS test statistic is used to analyse these data. According to the results of the analysis for the first differenced order data, chaotic structure has been found for each e values.